SYSTEM AND METHOD FOR AUTOMATIC EXTRACTION OF INTEGRATED CIRCUIT COMPONENT DATA

Described are various embodiments of a system and method for automatic extraction of integrated circuit component data. In one embodiment, a method is provided for automatically extracting transistor data from a digital representation of an integrated circuit that comprises digitally defining at least one diffusion space corresponding to a respective spatial region of the IC that comprises at least one diffusion feature. For each discrete diffusion space, diffusion space circuit features that intersect with each diffusion feature are incrementally assessed by assigning a current state value to each diffusion space circuit feature based on an identified feature characteristic associated therewith and an identified feature characteristic of an electrically adjacent feature in the diffusion space.