SIMULATION OF ATOMISTIC DEFECTS IN NANOELECTRONICS USING POLYHEDRAL MESHES

A simulation of an electronic device may use a distribution of atomistic defects to provide more accurate results. An input mesh may be received representing a physical structure of the electronic device. This input mesh may be transformed into a polyhedral mesh to facilitate the simulation. A distr...

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Bibliographische Detailangaben

Hauptverfasser:	BERTOCCHI, Matteo, VANDELLI, Luca, DOMINICI, Stefano, LARCHER, Luca
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING PHYSICS
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