METHODS FOR MEASURING ELECTRICAL PROPERTIES OF ELECTRO-OPTIC DISPLAYS

A method for driving electro-optic displays including electro-optic material disposed between a common electrode and a backplane. The backplane includes an array of pixel electrodes, each coupled to a transistor. A display controller applies waveforms to the pixel electrodes. The method includes app...

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Bibliographische Detailangaben
Hauptverfasser: LU, Yi, LADAVAC, Kosta, AMUNDSON, Karl Raymond, SIM, Teck Ping, MCCREARY, Michael D
Format: Patent
Sprache:eng ; fre ; ger
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Zusammenfassung:A method for driving electro-optic displays including electro-optic material disposed between a common electrode and a backplane. The backplane includes an array of pixel electrodes, each coupled to a transistor. A display controller applies waveforms to the pixel electrodes. The method includes applying first measurement waveforms to a first portion of the pixel electrodes. During each frame of the first measurement waveforms, the same time-dependent voltages are applied to each pixel electrode of the first portion of pixel electrodes. The method includes determining the impedance of the electro-optic material in proximity to the first portion of pixel electrodes based on a measurement of the current flowing through a current measurement circuit and the time-dependent voltages applied to each pixel electrode during the first measurement waveforms, and selecting driving waveforms based on the impedance of the electro-optic material in proximity to the first portion of pixel electrodes.