FAILURE DETECTION OF SAMPLE INTRODUCTION SYSTEMS
A method of operating a sample introduction system (200) of an inductively coupled plasma analytical instrument (300), the method comprising applying a trained classifier to instrument data, obtained from the analytical instrument, during operation of the analytical instrument, to detect whether the...
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Format: | Patent |
Sprache: | eng ; fre ; ger |
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Zusammenfassung: | A method of operating a sample introduction system (200) of an inductively coupled plasma analytical instrument (300), the method comprising applying a trained classifier to instrument data, obtained from the analytical instrument, during operation of the analytical instrument, to detect whether the sample introduction system (200) is operating in a normal state or in a failure state. The method further comprises activating an error procedure in the event that the sample introduction system (200) is operating in a failure state. The instrument data comprises signal data obtained from an analytical measurement made by the analytical instrument (300). The trained classifier is trained using a training data set comprising instrument data corresponding to the normal state of the sample introduction system (200). |
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