REAL-TIME MONITORING AND PROTECTION CIRCUIT FOR GAN TRANSISTORS TO PROTECT FROM AND MONITOR THE TRAPPING PHENOMENON
The invention relates to an electronic device provided with GaN-based transistors (11, 12), and comprising a control circuit configured to evaluate the drain-source on-state resistance (RDS1_ON) of at least one first transistor (11) of said transistors (11, 12)
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Format: | Patent |
Sprache: | eng ; fre ; ger |
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Zusammenfassung: | The invention relates to an electronic device provided with GaN-based transistors (11, 12), and comprising a control circuit configured to evaluate the drain-source on-state resistance (RDS1_ON) of at least one first transistor (11) of said transistors (11, 12) |
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