REAL-TIME MONITORING AND PROTECTION CIRCUIT FOR GAN TRANSISTORS TO PROTECT FROM AND MONITOR THE TRAPPING PHENOMENON

The invention relates to an electronic device provided with GaN-based transistors (11, 12), and comprising a control circuit configured to evaluate the drain-source on-state resistance (RDS1_ON) of at least one first transistor (11) of said transistors (11, 12)

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: NGUYEN, Van-Sang, CATELLANI, Stéphane, BIER, Anthony
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:The invention relates to an electronic device provided with GaN-based transistors (11, 12), and comprising a control circuit configured to evaluate the drain-source on-state resistance (RDS1_ON) of at least one first transistor (11) of said transistors (11, 12)