DEEP ELECTROMAGNETIC REBAR PROBE SYSTEM, AND METHOD OF USING SAME

A method for monitoring a first attribute of a target object within a non-magnetic structure using a first probe coupled to the non-magnetic structure and located proximate the target object at a first detection region, the method includes a) introducing, at the first detection region, a pulsed elec...

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Bibliographische Detailangaben
Hauptverfasser: HOGG, Stephen, LEI, Jai, LULOFF, Mark Stephen, ZAUGG, Torin
Format: Patent
Sprache:eng ; fre ; ger
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Zusammenfassung:A method for monitoring a first attribute of a target object within a non-magnetic structure using a first probe coupled to the non-magnetic structure and located proximate the target object at a first detection region, the method includes a) introducing, at the first detection region, a pulsed electromagnetic interrogation signal along the electromagnetic circuit and through the target object using a first transmitter; b) receiving, at the first detection region, a response electromagnetic signal that is induced in the target object and generating a corresponding response electrical signal comprising time information and voltage information using a first receiver; c) determining the first attribute of the target object at the first detection region; d) generating a corresponding first output signal; and e) comparing one of the first output signal and the first attribute, to a stored value for the first detection region to determine if a condition is met.