DEEP ELECTROMAGNETIC REBAR PROBE SYSTEM, AND METHOD OF USING SAME
A method for monitoring a first attribute of a target object within a non-magnetic structure using a first probe coupled to the non-magnetic structure and located proximate the target object at a first detection region, the method includes a) introducing, at the first detection region, a pulsed elec...
Gespeichert in:
Hauptverfasser: | , , , |
---|---|
Format: | Patent |
Sprache: | eng ; fre ; ger |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | A method for monitoring a first attribute of a target object within a non-magnetic structure using a first probe coupled to the non-magnetic structure and located proximate the target object at a first detection region, the method includes a) introducing, at the first detection region, a pulsed electromagnetic interrogation signal along the electromagnetic circuit and through the target object using a first transmitter; b) receiving, at the first detection region, a response electromagnetic signal that is induced in the target object and generating a corresponding response electrical signal comprising time information and voltage information using a first receiver; c) determining the first attribute of the target object at the first detection region; d) generating a corresponding first output signal; and e) comparing one of the first output signal and the first attribute, to a stored value for the first detection region to determine if a condition is met. |
---|