ANALYZING LOCATION MEASUREMENT ACCURACY

Apparatuses and method are disclosed for analyzing location measurement accuracy. One method (700) includes receiving (702) a first request to provide statistics, predictions, or a combination thereof corresponding to an accuracy of a location measurement for at least one user equipment. The method...

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Bibliographische Detailangaben
Hauptverfasser: KARAMPATSIS, Dimitrios, PATEROMICHELAKIS, Emmanouil
Format: Patent
Sprache:eng ; fre ; ger
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Beschreibung
Zusammenfassung:Apparatuses and method are disclosed for analyzing location measurement accuracy. One method (700) includes receiving (702) a first request to provide statistics, predictions, or a combination thereof corresponding to an accuracy of a location measurement for at least one user equipment. The method (700) includes determining (704) to retrieve, from a location management function, information corresponding to an accuracy of a measured location. The method (700) includes sending (706) a second request to retrieve measurement accuracy for a location measurement. The method (700) includes deriving (708) analytics for location measurement accuracy based on the measurement accuracy for the location measurement.