MANIPULATING AND INSPECTING LARGE AND HEAVY COMPONENTS

MANIPULATING AND INSPECTING LARGE AND HEAVY COMPONENTS

A scanning system includes first and second parallel rails. A gantry can span between the first rail and the second rail. The gantry can be movable along a length of the first rail and a length of the second rail. A vertical track can be mounted to the gantry. The vertical track can be movable with...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: WÜSTENBECKER, Michael
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:A scanning system includes first and second parallel rails. A gantry can span between the first rail and the second rail. The gantry can be movable along a length of the first rail and a length of the second rail. A vertical track can be mounted to the gantry. The vertical track can be movable with the gantry. A sample platform can coupled to the vertical track. The sample platform can be movable along the vertical track. A first support can extend between the first rail and the second rail. The first support can be at a first end of the first rail and a first end of the second rail. A second support can extend between the first rail and the second rail. The second support can be at a second end of the first rail and a second end of the second rail.