DEFLECTORS FOR ION BEAMS AND MASS SPECTROMETRY SYSTEMS COMPRISING THE SAME

Provided are ion detectors and systems that may employ such ion detectors such as mass spectrometers and other instruments. The ion detectors include a deflector that serves to generate an electric field with designed shape and strength that causes the ions passing into the detector to move along a...

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Bibliographische Detailangaben
Hauptverfasser: PATKIN, Adam J, BADIEI, Hamid R, CHEN, Tsung-Chi, WHITE, Thomas, RAKOV, Sergey
Format: Patent
Sprache:eng ; fre ; ger
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Zusammenfassung:Provided are ion detectors and systems that may employ such ion detectors such as mass spectrometers and other instruments. The ion detectors include a deflector that serves to generate an electric field with designed shape and strength that causes the ions passing into the detector to move along a deflection path. By selectively deflecting the charged ions from an initial propagation axis, the deflector effectively removes unwanted neutral particles from the ion path and reduces background in the resulting spectra.