TIME-OF-FLIGHT CIRCUITRY AND TIME-OF-FLIGHT METHOD
The present disclosure generally pertains to time-of-flight circuitry for determining a roundtrip delay of photons emitted by a light source and incident on a time-of-flight imaging element, the time-of-flight circuitry being configured to: determine a test number of photons at a test point of time...
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Format: | Patent |
Sprache: | eng ; fre ; ger |
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Zusammenfassung: | The present disclosure generally pertains to time-of-flight circuitry for determining a roundtrip delay of photons emitted by a light source and incident on a time-of-flight imaging element, the time-of-flight circuitry being configured to: determine a test number of photons at a test point of time and a reference number of photons at a reference point of time, the test point of time and the reference point of time being included in a measurement time interval of at least two measurement time intervals for which the test point of time is varied; and compare, for determining the roundtrip delay of the emitted photons, the test number of photons with the reference number of photons. |
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