DEFECT DETECTION METHOD AND DEVICE

A method and device for defect detection. The method includes: (210): obtaining a defect eigenvector of an image to be detected; (220): calculating a similarity score of the image to be detected for each known defect type according to the defect eigenvector; and (230): performing defect classificati...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	JIANG, Guannan, LIU, Yongfa, SHU, Annan
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL PHYSICS
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