DEFECT DETECTION METHOD AND DEVICE

DEFECT DETECTION METHOD AND DEVICE

A method and device for defect detection. The method includes: (210): obtaining a defect eigenvector of an image to be detected; (220): calculating a similarity score of the image to be detected for each known defect type according to the defect eigenvector; and (230): performing defect classificati...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: JIANG, Guannan, LIU, Yongfa, SHU, Annan
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
CALCULATING
COMPUTING
COUNTING
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
PHYSICS
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Beschreibung
Zusammenfassung:A method and device for defect detection. The method includes: (210): obtaining a defect eigenvector of an image to be detected; (220): calculating a similarity score of the image to be detected for each known defect type according to the defect eigenvector; and (230): performing defect classification on the image to be detected according to the similarity score. The similarity score between the defect eigenvector of the image to be detected and each known defect type is calculated, and then it is possible to distinguish known defects from unknown defects and accurately classify the known defects according to the similarity scores, so as to effectively detect the defects.