DEFECT DETECTION METHOD AND DEVICE
A method and device for defect detection. The method includes: (210): obtaining a defect eigenvector of an image to be detected; (220): calculating a similarity score of the image to be detected for each known defect type according to the defect eigenvector; and (230): performing defect classificati...
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| creator | JIANG, Guannan LIU, Yongfa SHU, Annan |
| description | A method and device for defect detection. The method includes: (210): obtaining a defect eigenvector of an image to be detected; (220): calculating a similarity score of the image to be detected for each known defect type according to the defect eigenvector; and (230): performing defect classification on the image to be detected according to the similarity score. The similarity score between the defect eigenvector of the image to be detected and each known defect type is calculated, and then it is possible to distinguish known defects from unknown defects and accurately classify the known defects according to the similarity scores, so as to effectively detect the defects. |
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| subjects | CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL PHYSICS |
| title | DEFECT DETECTION METHOD AND DEVICE |
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