THERMAL RUNAWAY PIN-POINT HEATING TEST

A method and apparatus permit the testing of electrochemical cells. The apparatus includes a heat source, a chamber, and a diffuser coupling the heat source to the chamber. The heat source applies heat via the diffuser to a pin-point section of the electrochemical cell. This application of heat caus...

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Bibliographische Detailangaben
Hauptverfasser: JAKES, Philip John, WONG, Tin-Lup, YEBKA, Bouziane
Format: Patent
Sprache:eng ; fre ; ger
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Beschreibung
Zusammenfassung:A method and apparatus permit the testing of electrochemical cells. The apparatus includes a heat source, a chamber, and a diffuser coupling the heat source to the chamber. The heat source applies heat via the diffuser to a pin-point section of the electrochemical cell. This application of heat causes a thermal runaway condition due to a localized internal short circuit in the electrochemical cell. It is then determined whether the electrochemical cell has vented, ruptured, or exploded in response to the application of the heat source to the thermal runaway pin-point section of the electrochemical cell.