APPARATUS AND METHOD FOR MEASURING SKIN CHARACTERISTIC

Provided is a method and an apparatus thereof for measuring a skin characteristic. The apparatus comprises a processor configured to receive, over a time period T, a first response indicating intensities of light of a first wavelength λ1 reflected from skin, and a second response indicating intensit...

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Bibliographische Detailangaben
Hauptverfasser: VERHAGEN, Rieko, VAN KEMPEN, Eric Gerard Marie, MAZARAKIS, Giorgos, VAN ABEELEN, Frank Anton, THUMMA, Kiran Kumar, BALTAZAR DOS SANTOS, Nuno Filipe, BOAMFA, Marius Iosif, WARMERDAM, Thomas Petrus Hendricus
Format: Patent
Sprache:eng ; fre ; ger
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