APPARATUS AND METHOD FOR MEASURING SKIN CHARACTERISTIC

Provided is a method and an apparatus thereof for measuring a skin characteristic. The apparatus comprises a processor configured to receive, over a time period T, a first response indicating intensities of light of a first wavelength λ1 reflected from skin, and a second response indicating intensities of light of a second wavelength λ2 reflected from the skin. It further receives a first indication of a total intensity of the light corresponding to the first response and a second total intensity of light corresponding to the second response, which are emitted to the skin over the time period T. A first variation curve (10) with the first response as a function of the first indication and a second variation curve (11) with the second response as a function of the second indication is determined. The processor further determines a portion of each variation curve, along which portion the variation is substantially linear. It then calculates slopes at at least one point in said portion of the variation curves, and determines a value of the skin characteristic from a ratio of the slopes.