AUGMENTED-FIELD-OF-VIEW, HIGH-RESOLUTION OPTICAL MICROSCOPY METHOD AND OPTICAL MICROSCOPE

The invention relates to an optical microscope (100) and a microscopy method. According to the invention, the microscope comprises an imaging module (200) comprising an optical beam splitter (40), a first optical system (41, 42, 43), a first camera (51), a second optical system (44, 45, 46, 47) and...

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Bibliographische Detailangaben
Hauptverfasser: NASSOY, Pierre, BADON, Amaury, RECHER, Gaëlle
Format: Patent
Sprache:eng ; fre ; ger
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Zusammenfassung:The invention relates to an optical microscope (100) and a microscopy method. According to the invention, the microscope comprises an imaging module (200) comprising an optical beam splitter (40), a first optical system (41, 42, 43), a first camera (51), a second optical system (44, 45, 46, 47) and a second camera (52), the second optical system (44, 45, 46, 47) and the second camera (52) being configured to acquire a low-magnification image, and the first optical system (41, 42, 43) comprising a reflective scanning device (42, 48) placed in a plane (72) optically conjugate with the Fourier plane (71) of the optical microscope (100), a controller (300) being configured to angularly orient the reflective scanning device (42, 48) so that the first camera (51) acquires at least one first image (61, 62, . . . , 6N) of a portion of the object field of the microscope objective (21, 22, 23).