TEST SYSTEM FOR DETECTING FAULTS IN MULTIPLE DEVICES OF THE SAME TYPE

Method and test system for testing a plurality of identical devices; the system comprising: a plurality of built-in self-test, BIST, devices; at least one processor; and at least one memory storing instructions that cause the test system at least to: randomly generate stimulus parameters; apply the...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Wielage, Paul, Schat, Jan-Peter
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!