TEST SYSTEM FOR DETECTING FAULTS IN MULTIPLE DEVICES OF THE SAME TYPE

Method and test system for testing a plurality of identical devices; the system comprising: a plurality of built-in self-test, BIST, devices; at least one processor; and at least one memory storing instructions that cause the test system at least to: randomly generate stimulus parameters; apply the generated stimulus parameters N times to the plurality of identical devices using the BIST devices; measure a response of the plurality of identical devices to the generated stimulus parameters to produce MxN response outputs, where M is a number of the plurality of identical devices; calculating a defect likelihood for a test set of the plurality of identical devices, a mean of the test set response outputs, a standard deviation of reference set response outputs, and a standard deviation of the test set response outputs; determine that the defect likelihood for the test set is greater than a first threshold value, wherein in such a case the steps are repeated to obtain updated data.