METHOD FOR IMAGING, MICROSCOPY SYSTEM, SET OF STRANDS
The present invention relates to a method for imaging a target structure (12), including applying a plurality of docking strands (14) to the target structure (12) such that the docking strands (14) dock to the target structure (12) and applying one or more scanning strands (16) to the target structu...
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Format: | Patent |
Sprache: | eng ; fre ; ger |
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Zusammenfassung: | The present invention relates to a method for imaging a target structure (12), including applying a plurality of docking strands (14) to the target structure (12) such that the docking strands (14) dock to the target structure (12) and applying one or more scanning strands (16) to the target structure (12). Each scanning strand (16) has a first docking section (18), which docks to the target structure (12), and at least a second docking section (20), which simultaneously docks to at least one of the docking strands (14). Each scanning strand (16) includes a marking (22) which is at least temporarily attached to the respective scanning strand (16) and is detectable by a detection means (24) to detect a location of the marking (22) along the target structure (12).The present invention further relates to a microscopy system (10) and a set (26) of strands for use with a microscope for imaging at least one target structure (12). |
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