3D CALIBRATION METHOD AND APPARATUS FOR MULTI-VIEW PHASE SHIFT PROFILOMETRY

Disclosed is a three-dimensional (3D) calibration method and device for multi-view phase shift profilometry. A 3D calibration method for multi-view phase shift profilometry, performed by a computer device, according to an example embodiment may include acquiring a phase that is data required for 3D...

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Bibliographische Detailangaben
Hauptverfasser: Kim, Min Hyuk, Cho, Hyeongjun
Format: Patent
Sprache:eng ; fre ; ger
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Zusammenfassung:Disclosed is a three-dimensional (3D) calibration method and device for multi-view phase shift profilometry. A 3D calibration method for multi-view phase shift profilometry, performed by a computer device, according to an example embodiment may include acquiring a phase that is data required for 3D reconstruction from parameters of at least one camera and a projector based on a phase measuring profilometry (PMP) method; defining a phase-to-depth function for each camera-and-projector combination and performing calibration of optimizing the parameters of the camera and the projector; and acquiring a point cloud that includes depth information using the optimized parameters of the camera and the projector.