METHOD AND DEVICE WITH DEFECT DETECTION
An apparatus including a processor configured to execute a plurality of instructions; and a memory storing the plurality of instructions, wherein execution of the plurality of instructions configures the processor to generate a defect prediction score of an input image through the use of a neural ne...
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| creator | KIM, Byungjai HAN, Seungju KIM, Youngdong LIM, Jongin |
| description | An apparatus including a processor configured to execute a plurality of instructions; and a memory storing the plurality of instructions, wherein execution of the plurality of instructions configures the processor to generate a defect prediction score of an input image through the use of a neural network provided reference image, the input image, and an enhanced image. The neural network may include an attention map modulator configured to adaptively adjust an intensity of an attention map generated during the use of the neural network. |
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The neural network may include an attention map modulator configured to adaptively adjust an intensity of an attention map generated during the use of the neural network.</description><language>eng ; fre ; ger</language><subject>CALCULATING ; COMPUTING ; COUNTING ; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL ; PHYSICS</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240508&DB=EPODOC&CC=EP&NR=4365834A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240508&DB=EPODOC&CC=EP&NR=4365834A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>KIM, Byungjai</creatorcontrib><creatorcontrib>HAN, Seungju</creatorcontrib><creatorcontrib>KIM, Youngdong</creatorcontrib><creatorcontrib>LIM, Jongin</creatorcontrib><title>METHOD AND DEVICE WITH DEFECT DETECTION</title><description>An apparatus including a processor configured to execute a plurality of instructions; and a memory storing the plurality of instructions, wherein execution of the plurality of instructions configures the processor to generate a defect prediction score of an input image through the use of a neural network provided reference image, the input image, and an enhanced image. The neural network may include an attention map modulator configured to adaptively adjust an intensity of an attention map generated during the use of the neural network.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFD3dQ3x8HdRcPRzUXBxDfN0dlUI9wzxALLdXJ1DgFQIkPL09-NhYE1LzClO5YXS3AwKbq4hzh66qQX58anFBYnJqXmpJfGuASbGZqYWxiaOhsZEKAEAfI8jIg</recordid><startdate>20240508</startdate><enddate>20240508</enddate><creator>KIM, Byungjai</creator><creator>HAN, Seungju</creator><creator>KIM, Youngdong</creator><creator>LIM, Jongin</creator><scope>EVB</scope></search><sort><creationdate>20240508</creationdate><title>METHOD AND DEVICE WITH DEFECT DETECTION</title><author>KIM, Byungjai ; HAN, Seungju ; KIM, Youngdong ; LIM, Jongin</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP4365834A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2024</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>KIM, Byungjai</creatorcontrib><creatorcontrib>HAN, Seungju</creatorcontrib><creatorcontrib>KIM, Youngdong</creatorcontrib><creatorcontrib>LIM, Jongin</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>KIM, Byungjai</au><au>HAN, Seungju</au><au>KIM, Youngdong</au><au>LIM, Jongin</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>METHOD AND DEVICE WITH DEFECT DETECTION</title><date>2024-05-08</date><risdate>2024</risdate><abstract>An apparatus including a processor configured to execute a plurality of instructions; and a memory storing the plurality of instructions, wherein execution of the plurality of instructions configures the processor to generate a defect prediction score of an input image through the use of a neural network provided reference image, the input image, and an enhanced image. The neural network may include an attention map modulator configured to adaptively adjust an intensity of an attention map generated during the use of the neural network.</abstract><oa>free_for_read</oa></addata></record> |
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| language | eng ; fre ; ger |
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| subjects | CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL PHYSICS |
| title | METHOD AND DEVICE WITH DEFECT DETECTION |
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