METHOD AND DEVICE WITH DEFECT DETECTION

METHOD AND DEVICE WITH DEFECT DETECTION

An apparatus including a processor configured to execute a plurality of instructions; and a memory storing the plurality of instructions, wherein execution of the plurality of instructions configures the processor to generate a defect prediction score of an input image through the use of a neural ne...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: KIM, Byungjai, HAN, Seungju, KIM, Youngdong, LIM, Jongin
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
CALCULATING
COMPUTING
COUNTING
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
PHYSICS
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Beschreibung
Zusammenfassung:An apparatus including a processor configured to execute a plurality of instructions; and a memory storing the plurality of instructions, wherein execution of the plurality of instructions configures the processor to generate a defect prediction score of an input image through the use of a neural network provided reference image, the input image, and an enhanced image. The neural network may include an attention map modulator configured to adaptively adjust an intensity of an attention map generated during the use of the neural network.