ELEMENT DISTRIBUTION MEASURING DEVICE AND ELEMENT DISTRIBUTION MEASURING METHOD

An element distribution measurement apparatus 1 is an apparatus for measuring a distribution of a content rate of each element contained in a measurement sample 4, and includes a measurement unit 2 and an operation unit 3. The measurement unit 2 acquires projection data by making rays of radiation o...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: MOCHIZUKI, Takahiro, NAKAMOTO, Katsuhiro
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:An element distribution measurement apparatus 1 is an apparatus for measuring a distribution of a content rate of each element contained in a measurement sample 4, and includes a measurement unit 2 and an operation unit 3. The measurement unit 2 acquires projection data by making rays of radiation of each of a plurality of spectra in a band including X-rays and γ-rays incident on the measurement sample 4. The operation unit 3 obtains the distribution of the content rate of each element contained in the measurement sample based on a distribution of a linear attenuation coefficient of the measurement sample obtained for each of the plurality of spectra based on the projection data acquired by the measurement unit 2, and a formula of the linear attenuation coefficient represented by using a value of a mass attenuation coefficient of each element, a value of an atomic weight of each element, a variable of the content rate of each element, and a variable of a density of the measurement sample for each of the plurality of spectra. Thus, an apparatus and a method capable of easily measuring a distribution of a content rate of each element contained in a measurement sample with an inexpensive configuration are realized.