MEASUREMENT METHOD AND MEASUREMENT APPARATUS

Embodiments of this application provide a measurement method and a measurement apparatus. The measurement method includes: acquiring a first image and a second image of a target object, where the first image is acquired by a camera located on a non-backlight side of the target object, and the second...

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Bibliographische Detailangaben
Hauptverfasser:	JIANG, Guannan, ZHUANG, Weilin, SHU, Annan
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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Beschreibung
Zusammenfassung:	Embodiments of this application provide a measurement method and a measurement apparatus. The measurement method includes: acquiring a first image and a second image of a target object, where the first image is acquired by a camera located on a non-backlight side of the target object, and the second image is acquired by a camera located on a backlight side of target object; and measuring the target object for size information according to the first image and the second image. The technical solution of this application can improve accuracy and precision of inspection while improving production efficiency.