MEASUREMENT ASSEMBLY, MEASUREMENT METHOD AND MEASUREMENT SYSTEM

This application provides a measurement assembly, a measurement method, and a measurement system. The measurement assembly includes a support beam and a flush gauge. The support beam includes a reference surface used to fit against a measurement reference surface, and a track extending parallel to t...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	LU, Qihuan, SUI, Zhenjie, HU, Xiaofeng
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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Beschreibung
Zusammenfassung:	This application provides a measurement assembly, a measurement method, and a measurement system. The measurement assembly includes a support beam and a flush gauge. The support beam includes a reference surface used to fit against a measurement reference surface, and a track extending parallel to the reference surface. The flush gauge includes a main body and a measurement rod. The main body is slidably disposed on the track, and the measurement rod includes a first end and a second end disposed opposite each other. The first end is fixedly connected to the main body, the second end is used to abut against a surface of an object being measured, and the second end is able to movable toward and away from the first end.