METHOD AND APPARATUS FOR PERFORMING DIE-LEVEL ELECTRICAL PARAMETER EXTRACTION THROUGH USING ESTIMATED MAPPING RELATIONSHIP BETWEEN ELECTRICAL PARAMETERS OF TRANSISTOR TYPES AND MEASUREMENT RESULTS OF LOGIC BLOCKS

Bibliographische Detailangaben

Hauptverfasser:	SHIEH, Jia-Horng, LEE, Chi-Ming, TING, Yi-Ju, LEE, Ming-Cheng, TSAO, Po-Chao, LEE, Tung-Hsing
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
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