APPARATUS AND METHOD FOR INSPECTION OF A MATERIAL

APPARATUS AND METHOD FOR INSPECTION OF A MATERIAL

A method of inspecting a material includes examining a surface of a test material with an eddy current sensor and applying an X-ray fluorescence analysis to the surface of the test material at the same location at which the eddy current examination was performed.

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Bibliographische Detailangaben
Hauptverfasser: POLICKE, Timothy, A, HAVENER, Aaron, C, MOHR, Thomas, C, SHELDON, Paul, D, LATHAM, Wayne, M, MANZINI, Richard
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:A method of inspecting a material includes examining a surface of a test material with an eddy current sensor and applying an X-ray fluorescence analysis to the surface of the test material at the same location at which the eddy current examination was performed.