SEMICONDUCTOR CHIP COMPRISING STRUCTURED METALLIZATION WITH INCREASED RELIABILITY, AND MANUFACTURING METHOD
The present disclosure relates to a semiconductor chip, having an aluminium layer, wherein said aluminium layer has a structuration of at least a portion of a surface receiving an additional deposition (Cu), and wherein said structuration forms peaks on said portion of surface occupying between 20 a...
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Format: | Patent |
Sprache: | eng ; fre ; ger |
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Zusammenfassung: | The present disclosure relates to a semiconductor chip, having an aluminium layer, wherein said aluminium layer has a structuration of at least a portion of a surface receiving an additional deposition (Cu), and wherein said structuration forms peaks on said portion of surface occupying between 20 and 80% of said portion of surface. |
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