UNIT CELL INSPECTION APPARATUS, ELECTRODE ASSEMBLY MANUFACTURING FACILITY INCLUDING SAME, AND ELECTRODE ASSEMBLY MANUFACTURING METHOD
A unit cell inspecting device according to the present invention includes an inspection unit which captures an image of an edge of a unit cell by using long-wave infrared rays and measures a position of an edge of an electrode provided in the unit cell. The inspection unit includes: a main heating p...
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Format: | Patent |
Sprache: | eng ; fre ; ger |
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Zusammenfassung: | A unit cell inspecting device according to the present invention includes an inspection unit which captures an image of an edge of a unit cell by using long-wave infrared rays and measures a position of an edge of an electrode provided in the unit cell. The inspection unit includes: a main heating part configured to heat the edge of the unit cell, thereby raising a temperature of the edge of the electrode provided in the unit cell; and an image capturing part configured to capture the image of the edge of the unit cell by using the long-wave infrared rays, thereby acquiring a thermal image of the edge of the electrode provided in the unit cell; and an inspection part configured to measure the edge of the electrode in the thermal image captured by the image capturing part, thereby measuring the position of the electrode by using the measured edge of the electrode. |
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