INSULATION CIRCUIT BOARD AND SEMICONDUCTOR DEVICE USING SAME
According to the embodiment, in an insulating circuit board (1) in which a conductor part (3, 4) is bonded to at least one surface of an insulating substrate (2), when XPS analysis of the carbon amount at the surface of the conductor part (3, 4) is performed, the average value of the carbon amounts...
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Zusammenfassung: | According to the embodiment, in an insulating circuit board (1) in which a conductor part (3, 4) is bonded to at least one surface of an insulating substrate (2), when XPS analysis of the carbon amount at the surface of the conductor part (3, 4) is performed, the average value of the carbon amounts at any three locations is within the range of not less than 0 at% and not more than 70 at%. When XPS analysis of the oxygen amount of the conductor part surface is performed, it is favorable for the average value of any three locations to be within the range of not less than 3 at% and not more than 50 at%. |
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