OBJECT CARRIER FOR MICROSCOPY, METHOD OF MAKING SAME AND METHOD OF MEASURING THEREWITH
The invention relates to an object carrier for microscopy (1) comprising an essentially plate-shaped substrate (2) which is non-conductive or at least coated with a non-conductive material wherein at least one microelectrode (4) is placed insular on the substrate (2) that can be contacted via a meas...
Gespeichert in:
Hauptverfasser: | , , , , , |
---|---|
Format: | Patent |
Sprache: | eng ; fre ; ger |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | The invention relates to an object carrier for microscopy (1) comprising an essentially plate-shaped substrate (2) which is non-conductive or at least coated with a non-conductive material wherein at least one microelectrode (4) is placed insular on the substrate (2) that can be contacted via a measuring tip (6) for the transmission of electrical signals.The invention further relates to a method for the manufacture of an object carrier for microscopy (1) mentioned above, the method comprisinga) providing the plate-shaped substrate (2)b) modification of the surface structure of the substrate (2) by at least one additive and/or subtractive manufacturing step by means of a focused ion beam. |
---|