OBJECT CARRIER FOR MICROSCOPY, METHOD OF MAKING SAME AND METHOD OF MEASURING THEREWITH

The invention relates to an object carrier for microscopy (1) comprising an essentially plate-shaped substrate (2) which is non-conductive or at least coated with a non-conductive material wherein at least one microelectrode (4) is placed insular on the substrate (2) that can be contacted via a meas...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: WILKE, Markus, WEBER, André, ECKE, Dr. Martin, TAKAGAKI, Dr. Kentaroh, HERRERA-MOLINA, Dr. Rodrigo, XIA, Zifeng
Format: Patent
Sprache:eng ; fre ; ger
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Beschreibung
Zusammenfassung:The invention relates to an object carrier for microscopy (1) comprising an essentially plate-shaped substrate (2) which is non-conductive or at least coated with a non-conductive material wherein at least one microelectrode (4) is placed insular on the substrate (2) that can be contacted via a measuring tip (6) for the transmission of electrical signals.The invention further relates to a method for the manufacture of an object carrier for microscopy (1) mentioned above, the method comprisinga) providing the plate-shaped substrate (2)b) modification of the surface structure of the substrate (2) by at least one additive and/or subtractive manufacturing step by means of a focused ion beam.