INFRARED THERMAL IMAGE ANALYSIS DEVICE, INFRARED THERMAL IMAGE ANALYSIS METHOD, AND PROGRAM

Provided are an infrared image analysis device, an infrared image analysis method, and a program capable of correctly reducing a temperature gradient. An infrared thermal image analysis device (10) includes a processor. The processor acquires a first infrared thermal image of a structure surface, wh...

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1. Verfasser:	KATSUYAMA Kimito
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	COLORIMETRY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING PHYSICS RADIATION PYROMETRY TESTING
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creator	KATSUYAMA Kimito
description	Provided are an infrared image analysis device, an infrared image analysis method, and a program capable of correctly reducing a temperature gradient. An infrared thermal image analysis device (10) includes a processor. The processor acquires a first infrared thermal image of a structure surface, which is obtained by capturing a structure (36) to be inspected, acquires region information (105) that distinguishes a region of the structure surface corresponding to the first infrared thermal image for at least one region, estimates a temperature gradient in the at least one region based on the region information (105) and a second infrared thermal image, and reduces an influence of the temperature gradient from the first infrared thermal image.
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language	eng ; fre ; ger
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subjects	COLORIMETRY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING PHYSICS RADIATION PYROMETRY TESTING
title	INFRARED THERMAL IMAGE ANALYSIS DEVICE, INFRARED THERMAL IMAGE ANALYSIS METHOD, AND PROGRAM
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