INFRARED THERMAL IMAGE ANALYSIS DEVICE, INFRARED THERMAL IMAGE ANALYSIS METHOD, AND PROGRAM

INFRARED THERMAL IMAGE ANALYSIS DEVICE, INFRARED THERMAL IMAGE ANALYSIS METHOD, AND PROGRAM

Provided are an infrared image analysis device, an infrared image analysis method, and a program capable of correctly reducing a temperature gradient. An infrared thermal image analysis device (10) includes a processor. The processor acquires a first infrared thermal image of a structure surface, wh...

Ausführliche Beschreibung

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Bibliographische Detailangaben
1. Verfasser: KATSUYAMA Kimito
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
COLORIMETRY
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT
MEASURING
PHYSICS
RADIATION PYROMETRY
TESTING
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Beschreibung
Zusammenfassung:Provided are an infrared image analysis device, an infrared image analysis method, and a program capable of correctly reducing a temperature gradient. An infrared thermal image analysis device (10) includes a processor. The processor acquires a first infrared thermal image of a structure surface, which is obtained by capturing a structure (36) to be inspected, acquires region information (105) that distinguishes a region of the structure surface corresponding to the first infrared thermal image for at least one region, estimates a temperature gradient in the at least one region based on the region information (105) and a second infrared thermal image, and reduces an influence of the temperature gradient from the first infrared thermal image.