NEPHELOMETRIC MEASURING DEVICE(S)

Nephelometric measuring devices are described. The nephelometric measuring devices can be configured such that an amount of scattered light having different pathlengths impingent upon one or more scattered-light detectors from a beam propagating through a suspension can result in substantially equivalent sensitivity and in correlation between the scattered-light detectors' response and a turbidity value of the suspension. The response of the scattered-light detector(s) receiving scattered light at a nephelometric angle of 85-110° from a beam of light propagating through the suspension can be in accordance to an equation selected from a group of non-linear equations where:x/y=aoxn+ ++a2x2+aix+ao; where "n" is an integer greater than 0; "x" is equal to the turbidity value of the suspension; "y" is equal to the response of the scattered-light detector; and "an" are calibration coefficients. The maximum response of the scattered-light detector occurs at a turbidity value dependent upon the effective scattered-light pathlength.