ELECTROMAGNETIC FIELD ANALYSIS PROGRAM, ELECTROMAGNETIC FIELD ANALYSIS DEVICE, AND ELECTROMAGNETIC FIELD ANALYSIS METHOD

A dimension of a width and a dimension of a thickness of wiring included in first circuit information are specified, second circuit information is generated by changing one of the dimension of the width or the dimension of the thickness to zero based on a ratio between the dimension of the width and...

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Bibliographische Detailangaben
Hauptverfasser: YAMADA, Hiroaki, YAMAZAKI, Takashi, KOCHIBE, Yoichi, OHARA, Toshiyasu, YAMANE, Shohei
Format: Patent
Sprache:eng ; fre ; ger
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Zusammenfassung:A dimension of a width and a dimension of a thickness of wiring included in first circuit information are specified, second circuit information is generated by changing one of the dimension of the width or the dimension of the thickness to zero based on a ratio between the dimension of the width and the dimension of the thickness, and an electromagnetic field analysis is executed based on the second circuit information.