EQUIVALENT CIRCUIT ANALYSIS PROGRAM, EQUIVALENT CIRCUIT ANALYSIS DEVICE, AND EQUIVALENT CIRCUIT ANALYSIS METHOD

EQUIVALENT CIRCUIT ANALYSIS PROGRAM, EQUIVALENT CIRCUIT ANALYSIS DEVICE, AND EQUIVALENT CIRCUIT ANALYSIS METHOD

A surface pattern included in first circuit information is specified, second circuit information in which the surface pattern is changed to a line pattern is generated based on a wire of a layer adjacent to the surface pattern, and an equivalent circuit analysis is executed based on the second circu...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: YAMADA, Hiroaki, YAMAZAKI, Takashi, KOCHIBE, Yoichi, OHARA, Toshiyasu, YAMANE, Shohei
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
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Beschreibung
Zusammenfassung:A surface pattern included in first circuit information is specified, second circuit information in which the surface pattern is changed to a line pattern is generated based on a wire of a layer adjacent to the surface pattern, and an equivalent circuit analysis is executed based on the second circuit information.