MICROSCOPE APPARATUS, METHOD FOR MEASURING REFRACTIVE INDEX OF SAMPLE USING MICROSCOPE APPARATUS, AND PROGRAM FOR MEASURING REFRACTIVE INDEX OF SAMPLE USING MICROSCOPE APPARATUS

A microscope apparatus (1) comprising: an illumination optical system (20) that guides light from a light source (17) to a sample (TP) ; a detection unit (51) that detects light from the sample (TP) ; a detection optical system (40) that has an objective lens (30) and guides light from the sample (T...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	NIITANI, Yamato
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PHYSICS TESTING
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