MICROSCOPE APPARATUS, METHOD FOR MEASURING REFRACTIVE INDEX OF SAMPLE USING MICROSCOPE APPARATUS, AND PROGRAM FOR MEASURING REFRACTIVE INDEX OF SAMPLE USING MICROSCOPE APPARATUS

A microscope apparatus (1) comprising: an illumination optical system (20) that guides light from a light source (17) to a sample (TP) ; a detection unit (51) that detects light from the sample (TP) ; a detection optical system (40) that has an objective lens (30) and guides light from the sample (T...

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Bibliographische Detailangaben
1. Verfasser: NIITANI, Yamato
Format: Patent
Sprache:eng ; fre ; ger
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Zusammenfassung:A microscope apparatus (1) comprising: an illumination optical system (20) that guides light from a light source (17) to a sample (TP) ; a detection unit (51) that detects light from the sample (TP) ; a detection optical system (40) that has an objective lens (30) and guides light from the sample (TP) to the detection unit (51); a mask (27) that allows a portion of light from the sample (TP) and light from the light source (17) to pass therethrough, and blocks the other portion; a mask-switching unit (28) that changes mask patterns of the mask (27); a microscope control unit (80); and an information-processing device (90). The microscope control unit (80) controls the mask-switching unit (28) to change mask patterns. The information-processing device (90) obtains information about the amount of movement of the focus position of the optical system including the objective lens (30) when mask patterns are changed, and calculates the refractive index of the sample (TP) on the basis of the obtained information about the amount of movement of the focus position.