MONITORING OF X-RAY TUBE
The invention relates to an optical monitoring system (200) for monitoring an X-ray tube (100), the optical monitoring system (200) comprising: at least one optical sensor (201) configured to detect first signals of a first optical parameter and second signals of a second optical parameter thereby g...
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Format: | Patent |
Sprache: | eng ; fre ; ger |
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Zusammenfassung: | The invention relates to an optical monitoring system (200) for monitoring an X-ray tube (100), the optical monitoring system (200) comprising: at least one optical sensor (201) configured to detect first signals of a first optical parameter and second signals of a second optical parameter thereby generating measurement data, wherein the first and second optical parameters are selected from the group comprising plasma glow, discharges, micro-discharges, arcs, x-ray fluorescence, line emissions, wherein the first and second optical parameters are different from each other, the optical monitoring system (200) further comprising a computing unit (202) configured to transmit, to a remote system(300) external of optical monitoring system (200) and the X-ray tube (100), said generated measurement data and/or a result of an analysis of measurement data carried out by the computing unit (202). The invention further relates to a unit comprising an X-ray tube (100) and such an optical monitoring system (200), as well as to a method (400) for monitoring an X-ray tube (100). |
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