METHODS AND APPARATUS FOR DETERMINING DIELECTRIC CONSTANT AND RESISTIVITY WITH ELECTROMAGNETIC PROPAGATION MEASUREMENTS

A method for estimating resistivity and dielectric constant values of a multi-layer subterranean formation acquiring electromagnetic propagation measurements of the subterranean formation and processing the measurements via inversion to compute the resistivity and dielectric constant values. A one-d...

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Hauptverfasser: MA, Shouxiang, WANG, Gong Li, ZHANG, Ping, HOMAN, Dean M, ABDALLAH, Wael
Format: Patent
Sprache:eng ; fre ; ger
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Zusammenfassung:A method for estimating resistivity and dielectric constant values of a multi-layer subterranean formation acquiring electromagnetic propagation measurements of the subterranean formation and processing the measurements via inversion to compute the resistivity and dielectric constant values. A one-dimensional formation model is utilized including a plurality of formation layers in which each of the formation layers includes a resistivity value and a dielectric constant value.