METHODS AND APPARATUS FOR DETERMINING DIELECTRIC CONSTANT AND RESISTIVITY WITH ELECTROMAGNETIC PROPAGATION MEASUREMENTS
A method for estimating resistivity and dielectric constant values of a multi-layer subterranean formation acquiring electromagnetic propagation measurements of the subterranean formation and processing the measurements via inversion to compute the resistivity and dielectric constant values. A one-d...
Gespeichert in:
Hauptverfasser: | , , , , |
---|---|
Format: | Patent |
Sprache: | eng ; fre ; ger |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | A method for estimating resistivity and dielectric constant values of a multi-layer subterranean formation acquiring electromagnetic propagation measurements of the subterranean formation and processing the measurements via inversion to compute the resistivity and dielectric constant values. A one-dimensional formation model is utilized including a plurality of formation layers in which each of the formation layers includes a resistivity value and a dielectric constant value. |
---|