SYSTEMS AND METHODS FOR PERFORMING MICROSCOPIC ANALYSIS OF A SAMPLE

The present description relates to a system for microscopic analysis of a sample that includes a microscopic analysis path and a sighting path. The microscopic analysis path notably includes an illumination path that illuminates the sample through a microscope objective of given nominal numerical ap...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: LEVECQ, Olivier, OGIEN, Jonas
Format: Patent
Sprache:eng ; fre ; ger
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Beschreibung
Zusammenfassung:The present description relates to a system for microscopic analysis of a sample that includes a microscopic analysis path and a sighting path. The microscopic analysis path notably includes an illumination path that illuminates the sample through a microscope objective of given nominal numerical aperture in a given field of view and a detection path including the microscope objective, and that detects in the field of view and according to a detection pattern, a light beam emitted by the sample in response to the illumination of the sample. The sighting path includes the microscope objective, a device for full field illumination of the sample, a two-dimensional detector, one or more imaging elements forming, with the microscope objective, a full field imaging device that forms a surface reflection sighting image of the sample of a given effective field encompassing the field of view.