MEASURING WAVELENGTH OF LIGHT

In a general aspect, a wavelength of light is measured. In some aspects, a wavelength measurement system includes an interferometer, a camera system, a sensor and a control system. The interferometer includes two reflective surfaces and a transmission medium between the two reflective surfaces. The...

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Bibliographische Detailangaben
Hauptverfasser: LIU, Chang, ERSKINE, Jennifer Ann Joe, KEAVENEY, James, GILLETT, Geoffrey Gordon, SHAFFER, James P
Format: Patent
Sprache:eng ; fre ; ger
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Beschreibung
Zusammenfassung:In a general aspect, a wavelength of light is measured. In some aspects, a wavelength measurement system includes an interferometer, a camera system, a sensor and a control system. The interferometer includes two reflective surfaces and a transmission medium between the two reflective surfaces. The interferometer is configured to receive an optical signal from a laser and produce an interferogram in response. The camera system is configured to receive the interferogram from the interferometer and generate interferogram data in response. The interferogram data represents the interferogram received from the interferometer. The sensor is configured to sense an environmental parameter of the transmission medium and generate sensor data in response. The control system is configured to perform operations including, receiving the interferogram data from the camera system and the sensor data from the sensor; and computing a wavelength of the laser based on the interferogram data and the sensor data.