METHOD OF DETERMINATION OF METROLOGICAL CHARACTERISTICS OF INSTRUMENT CHANNEL (VARIANTS)

In first variant, the method of determination of instruments channels (IC) metrological characteristics (MC) comprising input of reference value Xref to the measuring instrument (MI), the suspension of output of measuring signal, value of which depends functionally on the measured parameter, transmi...

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Bibliographische Detailangaben
1. Verfasser:	KALASHNIKOV, Aleksandr Aleksandrovich
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
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Beschreibung
Zusammenfassung:	In first variant, the method of determination of instruments channels (IC) metrological characteristics (MC) comprising input of reference value Xref to the measuring instrument (MI), the suspension of output of measuring signal, value of which depends functionally on the measured parameter, transmitting instead of measurement signal a test signal, value of which depends functionally on Xref, obtaining the indication Yic reading on the IC information processing device and / or displaying device when the test signal is received, metrological characteristics of the IC and/or its components are calculated taking into account values of Xref and YIC. According to second variant of the method, the channel includes the MI with digital and analog outputs, the MI analog output is connected to cable lines of IC, which transmits obtained readings to one input of a calculation unit (CU) and another CU input is connected directly to the MI digital output via digital data interface, wherein CU calculates the IC metrological characteristics according to preset program.