NON-DESTRUCTIVE TESTING DEVICE CUSTOMIZATION

A method for customizing non-destructive testing is provided and includes receiving, by a non-destructive testing (NDT) device, a stock application. The method further includes the device performing a stock NDT function in response to execution of the stock application. The stock NDT function can include a first device manipulation, a first NDT data acquisition by a device sensor, a first analysis employing data acquired by the first NDT data acquisition, or a first NDT output. The method additionally includes the device receiving a custom application after receipt of the stock application. The method also includes the device performing a custom NDT function, different from the stock NDT functions, and including at least one of a second device manipulation, a second NDT data acquisition by a sensor of the device, a second analysis employing data acquired by the second NDT data acquisition, or a second NDT output.