TESTING CHIP AND METHOD FOR MANUFACTURING SAME

Provided is a test chip capable of significantly suppressing unevenness in the color development. The test chip includes a sheet shape and includes a first layer on a front side and a second layer on a back side, wherein the first layer and the second layer are located adjacent to each other. One of...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	MONJU Takuya, SUMA Motoki
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PERFORMING OPERATIONS PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL PHYSICS TESTING TRANSPORTING
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