TESTING CHIP AND METHOD FOR MANUFACTURING SAME

Provided is a test chip capable of significantly suppressing unevenness in the color development. The test chip includes a sheet shape and includes a first layer on a front side and a second layer on a back side, wherein the first layer and the second layer are located adjacent to each other. One of...

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Bibliographische Detailangaben
Hauptverfasser:	MONJU Takuya, SUMA Motoki
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PERFORMING OPERATIONS PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL PHYSICS TESTING TRANSPORTING
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Beschreibung
Zusammenfassung:	Provided is a test chip capable of significantly suppressing unevenness in the color development. The test chip includes a sheet shape and includes a first layer on a front side and a second layer on a back side, wherein the first layer and the second layer are located adjacent to each other. One of the first layer and the second layer has a liquid receiving section A. The first layer has at least a detection confirmation section B. The second layer has at least a liquid flow section D adjacent to the detection confirmation section B and a liquid passage E connected to the liquid flow section D. The test chip is configured such that, in case where the liquid receiving section A is provided in the first layer, the liquid receiving section A is spaced from the detection confirmation section B and a test liquid dropped into the liquid receiving section A passes through the liquid receiving section A, the liquid passage E, and the liquid flow section D in the stated order, by means of capillary action, and flows to the detection confirmation section B.