SYSTEMS AND METHODS FOR OBJECT MEASUREMENT

The present disclosure relates to systems and methods for object measurement. The systems may obtain an image of an object with a light bar acquired by an imaging device. The light bar may be formed by an optical sensor irradiating the object with a light beam. The systems may obtain a measurement m...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	LIU, Yu, ZHOU, Yunke, ZHOU, Lu
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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Beschreibung
Zusammenfassung:	The present disclosure relates to systems and methods for object measurement. The systems may obtain an image of an object with a light bar acquired by an imaging device. The light bar may be formed by an optical sensor irradiating the object with a light beam. The systems may obtain a measurement model. The measurement model may be configured to simulate a curved surface formed by the light beam. The systems may determine position information of at least a portion of the object based at least in part on the image of the object with the light bar and the measurement model.