METHOD AND DEVICE FOR ASSESSING THE QUALITY OF A PROCESSING PROCESS
In a method and device for assessing the quality of a processing operation, a workpiece with specific processing parameters is processed along a processing trajectory. The (X), wherein the processing result is measured by at least one sensor and at least one sensor signal is recorded and at least on...
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Format: | Patent |
Sprache: | eng ; fre ; ger |
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Zusammenfassung: | In a method and device for assessing the quality of a processing operation, a workpiece with specific processing parameters is processed along a processing trajectory. The (X), wherein the processing result is measured by at least one sensor and at least one sensor signal is recorded and at least one quality parameter is determined based on at least one sensor signal and the at least one quality parameter is compared with quality parameter threshold values to assess the quality of the processing result. During the assessment of the processing operation quality, changes made to the processing parameters from target values during the processing are automatically taken into consideration, in that, instead of the quality parameter threshold values, quality parameter threshold values adapted to the changes in the processing parameters are determined, and the at least one quality parameter for assessing the quality of the processing result is compared with the adapted quality parameter threshold values. |
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