MEASURING JIG, AND CALIBRATION METHOD AND TERAHERTZ WAVE MEASURING METHOD USING SAME

The invention is configured to include a spectroscopy cell 100 as a container including one or more spaces, each of which has a plate shape and contains a to-be-measured object that transmits or reflects a terahertz wave; and a holder 6 including one or more first holder through-holes 6b and 6c disp...

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Bibliographische Detailangaben
Hauptverfasser:	OKUNO, Tadashi, WATANABE, Akira, UEDA, Takeji
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
Online-Zugang:	Volltext bestellen
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Beschreibung
Zusammenfassung:	The invention is configured to include a spectroscopy cell 100 as a container including one or more spaces, each of which has a plate shape and contains a to-be-measured object that transmits or reflects a terahertz wave; and a holder 6 including one or more first holder through-holes 6b and 6c disposed at positions corresponding to the spaces of the spectroscopy cell 100, each of the spaces containing the to-be-measured object. A body portion 1 of the spectroscopy cell 100 is made of a resin material that transmits the terahertz wave, and the spectroscopy cell 100 is loaded into the holder 6 and is used. The holder 6 has a function of holding the spectroscopy cell 100, and a function of correcting one or more of a distortion, a twist, and a bending of the spectroscopy cell 100.